Pushing beyond the limits of conventional metrology — enabling next-generation semiconductor and advanced R&D technologies.
Sub-micron precision. Real-time spectroscopy. Engineered beyond conventional metrology.
Tools which are enablers
For research labs (university and industrial R&D) to investigate new phenomena in optics and material sciences.
For manufacturers in semiconductor industry to fundamentally improve yield learning cycles and to replace the fragmented workflow.
Outstanding qualities
Fast spectral analysis.
Sub-nm spectral resolution.
nm spacial resolution.
μrad angular resolution.
Optimized Solutions
Precision.
Robustness and reliability.
Tailored under your needs and requirements.
Support by qualified engineers.
Made-to-measure Instruments
UHV characterization of:
Nano-materials and structures
Thin metal- and semiconductor films.
Semiconductor materials.
Meta-materials.
Photonics and Nano-photonics:
Si photonics compatible
CMOS compatible
Providing technology for smart solutions
Develop your technological drawbacks or scientifical striving into frontrunner advantage with us.
- Engineered for Ultimate Sensitivity
- High-Resolution Measurement Performance
- Designed for Advanced Research and Industry
- Flexible, Automated, and Remote-Ready
- Professional Engineering
- Backed up by science
Contact Us Now
office@analytics-gmbh.com
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Analytical instruments for Instruments Semiconductor industry
Tailored solutions for Universities & Institutes
Instruments for Industrial R&D Labs
ISO & CE Standards
Novel method
Advanced Solutions
Our Featured Works
Explore how our technologies are applied in real-world research and industrial environments. Our instruments power experiments that push the boundaries of materials science, photonics, and semiconductor process development. Every system reflects our commitment to precision engineering and scientific excellence.
Our team is friendly, engaging, and 100% reliable
